ICon

Compact position and multi-layer thickness optical measurement system

ICon and ICon SL (Scanning Lens) are accurate non-contact position and multi-layer thickness measurement systems that are designed to measure an array of different materials. ICon uses a confocal scanning technique to provide a localised point measurement that is un-affected by surrounding media, which is a key advantage over other optical measurement systems. ICon has a standard measurement range of 3 mm, a working distance of 10 mm and a minimum measureable thickness of 50 µm. ICon SL has a standard measurement range of 4.7 mm, a working distance of 10.5 mm and a minimum measureable thickness of 40 µm. Other optical configurations are available. The ICon technology can be fully customised and integrated into your equipment, providing an elegant solution for your measurement needs.

 

Features

 

Applications

 

Technical Specification, ICon

Parameter

Value

Measurement Range

3 mm

Working Distance

10 mm

Minimum Measureable Thickness

50 µm

Spatial Resolution

0.9 µm

Linearity

3 µm

Wavelength

1310 nm

Maximum Angle
Spot Size 6 µm

Scan Rate

30 Hz

 

Technical Specification, ICon SL

Parameter

Value

Measurement Range

4.7 mm

Working Distance

10.5 mm

Minimum Measureable Thickness

40 µm

Spatial Resolution

2 µm

Linearity

5 µm

Wavelength

1310 nm

Maximum Angle 7.5º
Spot Size 6 µm

Scan Rate

30 Hz

 

Mechanical Drawings

ICon

 

 

 

 

ICon SL

 

 

 

Electronics

 
Lein Applied Diagnostics Ltd reserves the right to update and improve this specification without prior notice.

 

Download

ICon datasheet